Manufacturers developing products for use in SIF/SIS are improving their products’ ability to detect failures with added diagnostic capabilities. These diagnostics can have a significant impact by increasing the product’s inherent safe behavior. Advanced diagnostics typically lead to a lower Dangerous Undetected (DU) failure rate and therefore a higher Safe Failure Fraction (SFF). Purchasing a product with advanced diagnostics can lead to an overall lifecycle cost savings, i.e. extending proof-test intervals and/or non-redundant applications. Proof-test extensions can also result in less process interruption and personnel exposure.
Make sure to register for Emerson Exchange to attend this course being led by Exida’s Iwan van Beurden and me, Tonya Wyatt, and see why advanced diagnostics are useful.
Don’t forget: If you register for Emerson Exchange by September 30, you can save $200 off the regular conference registration price.
